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1

The P300: A system for automatic patterned wafer inspection

Byron E. Dom, Virginia H. Brecher, Raymond Bonner, John S. Batchelder, Robert S. Jaffe

Journal:

Machine Vision and Applications

Year:

1988

Language:

english

File:

PDF, 2.31 MB

english, 1988

2

Recent advances in the automatic inspection of integrated circuits for pattern defects

Byron E. Dom, Virginia Brecher

Journal:

Machine Vision and Applications

Year:

1995

Language:

english

File:

PDF, 2.67 MB

english, 1995

3

[ACM Press the 8th ACM SIGMOD workshop - San Diego, California (2003.06.13-2003.06.13)] Proceedings of the 8th ACM SIGMOD workshop on Research issues in data mining and knowledge discovery - DMKD '03 - Graph-based ranking algorithms for e-mail expertise analysis

Dom, Byron, Eiron, Iris, Cozzi, Alex, Zhang, Yi

Year:

2003

Language:

english

File:

PDF, 183 KB

english, 2003

4

SPIE Proceedings [SPIE Photonics West '98 Electronic Imaging - San Jose, CA (Saturday 24 January 1998)] Storage and Retrieval for Image and Video Databases VI - Updates to the QBIC system

Niblack, Carlton W., Zhu, Xiaoming, Hafner, James L., Breuel, Tom, Ponceleon, Dulce B., Petkovic, Dragutin, Flickner, Myron D., Upfal, Eli, Nin, Sigfredo I., Sull, Sanghoon, Dom, Byron E., Yeo, Boon-L

Year:

1997

Language:

english

File:

PDF, 3.30 MB

english, 1997

5

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Alignment mark detection using signed-contrast gradient edge maps

Jordan III, John R., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 1.22 MB

english, 1992

6

Automatic resource compilation by analyzing hyperlink structure and associated text

Soumen Chakrabarti, Byron Dom, Prabhakar Raghavan, Sridhar Rajagopalan, David Gibson, Jon Kleinberg

Journal:

Computer Networks and ISDN Systems

Year:

1998

Language:

english

File:

PDF, 2.37 MB

english, 1998

7

Focused crawling: a new approach to topic-specific Web resource discovery

Soumen Chakrabarti, Martin van den Berg, Byron Dom

Journal:

Computer Networks

Year:

1999

Language:

english

File:

PDF, 297 KB

english, 1999

8

Errata

Byron E. Dom, Virginia H. Brecher, Raymond Bonner, John S. Batchelder, Robert S. Jaffe

Journal:

Machine Vision and Applications

Year:

1989

File:

PDF, 20 KB

1989

9

Scalable feature selection, classification and signature generation for organizing large text databases into hierarchical topic taxonomies

Soumen Chakrabarti, Byron Dom, Rakesh Agrawal, Prabhakar Raghavan

Journal:

The VLDB Journal

Year:

1998

Language:

english

File:

PDF, 275 KB

english, 1998

10

Topic Distillation and Spectral Filtering

Soumen Chakrabarti, Byron E. Dom, David Gibson, Ravi Kumar, Prabhakar Raghavan, Sridhar Rajagopalan, Andrew Tomkins

Journal:

Artificial Intelligence Review

Year:

1999

Language:

english

File:

PDF, 145 KB

english, 1999

11

[ACM Press the 17th ACM SIGKDD international conference - San Diego, California, USA (2011.08.21-2011.08.24)] Proceedings of the 17th ACM SIGKDD international conference on Knowledge discovery and data mining - KDD '11 - A time-dependent topic model for multiple text streams

Hong, Liangjie, Dom, Byron, Gurumurthy, Siva, Tsioutsiouliklis, Kostas

Year:

2011

Language:

english

File:

PDF, 575 KB

english, 2011

12

[ACM Press the twelfth international conference - New Orleans, LA, USA (2003.11.03-2003.11.08)] Proceedings of the twelfth international conference on Information and knowledge management - CIKM '03 - Expertise identification using email communications

Campbell, Christopher S., Maglio, Paul P., Cozzi, Alex, Dom, Byron

Year:

2003

Language:

english

File:

PDF, 159 KB

english, 2003

13

[ACM Press the fourth ACM international conference - Hong Kong, China (2011.02.09-2011.02.12)] Proceedings of the fourth ACM international conference on Web search and data mining - WSDM '11 - Scalable clustering of news search results

Vadrevu, Srinivas, Teo, Choon Hui, Rajan, Suju, Punera, Kunal, Dom, Byron, Smola, Alexander J., Chang, Yi, Zheng, Zhaohui

Year:

2011

Language:

english

File:

PDF, 763 KB

english, 2011

14

[ACM Press the 14th ACM international conference - Bremen, Germany (2005.10.31-2005.11.05)] Proceedings of the 14th ACM international conference on Information and knowledge management - CIKM '05 - A structure-sensitive framework for text categorization

Ramakrishnan, Ganesh, Paranjpe, Deepa, Dom, Byron

Year:

2005

Language:

english

File:

PDF, 89 KB

english, 2005

15

[ACM Press the 1998 ACM SIGMOD international conference - Seattle, Washington, United States (1998.06.01-1998.06.04)] Proceedings of the 1998 ACM SIGMOD international conference on Management of data - SIGMOD '98 - Enhanced hypertext categorization using hyperlinks

Chakrabarti, Soumen, Dom, Byron, Indyk, Piotr

Year:

1998

Language:

english

File:

PDF, 1.82 MB

english, 1998

16

[ACM Press the 2004 ACM SIGKDD international conference - Seattle, WA, USA (2004.08.22-2004.08.25)] Proceedings of the 2004 ACM SIGKDD international conference on Knowledge discovery and data mining - KDD '04 - Document preprocessing for naive Bayes classification and clustering with mixture of multinomials

Pavlov, Dmitry, Balasubramanyan, Ramnath, Dom, Byron, Kapur, Shyam, Parikh, Jignashu

Year:

2004

Language:

english

File:

PDF, 123 KB

english, 2004

17

[ACM Press Special interest tracks and posters of the 14th international conference - Chiba, Japan (2005.05.10-2005.05.14)] Special interest tracks and posters of the 14th international conference on World Wide Web - WWW '05 - How search engines shape the web

Dom, Byron, Bharat, Krishna, Broder, Andrei, Najork, Marc, Pedersen, Jan, Tonomura, Yoshinobu

Year:

2005

File:

PDF, 111 KB

2005

18

[ACM Press the 12th ACM SIGKDD international conference - Philadelphia, PA, USA (2006.08.20-2006.08.23)] Proceedings of the 12th ACM SIGKDD international conference on Knowledge discovery and data mining - KDD '06 - Linear prediction models with graph regularization for web-page categorization

Zhang, Tong, Popescul, Alexandrin, Dom, Byron

Year:

2006

Language:

english

File:

PDF, 730 KB

english, 2006

19

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Offline recognition of handwritten cursive words

Favata, John T., Srihari, Sargur N., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 622 KB

english, 1992

20

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Noisy Hangul character recognition with fuzzy tree classifier

Lee, Seong-Whan, D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 344 KB

english, 1992

21

[ACM Press the 18th international conference - Madrid, Spain (2009.04.20-2009.04.24)] Proceedings of the 18th international conference on World wide web - WWW '09 - Threshold selection for web-page classification with highly skewed class distribution

He, Xiaofeng, Duan, Lei, Zhou, Yiping, Dom, Byron

Year:

2009

Language:

english

File:

PDF, 590 KB

english, 2009

22

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Contrast enhancement of mail piece images

Shin, Yong-Chul, Sridhar, Ramalingam, Demjanenko, Victor, Palumbo, Paul W., Hull, Jonathan J., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 752 KB

english, 1992

23

SPIE Proceedings [SPIE IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 6 February 1994)] Machine Vision Applications in Industrial Inspection II - Disaster detector: an automatic disk head/slider inspection system

Dom, Byron E., Steele, David A., Krebs, Richard, Kiehl, David R., Saldanha, Patrick, Wong, Eric K., Moffitt, John W., Petkovic, Dragutin, Herber, John, Kuhlmann, Lionel, Dunbar, Scott, Dawson, Benjami

Year:

1994

Language:

english

File:

PDF, 2.35 MB

english, 1994

24

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Three-dimensional inspection of integrated circuits: a depth from focus approach

Binefa, Xavier, Vitria, Jordi M., Villanueva, Juan J., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 276 KB

english, 1992

25

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Morphological approach to machine-printed character recognition: a feasibility study

Krtolica, Radovan V., Warner, Brian, D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 317 KB

english, 1992

26

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Advanced Via Inspection Tool

Kim, Douglas Y., Muller, Kurt, Thorp, Lawrence D., Bird, Kenneth A., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 630 KB

english, 1992

27

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Syntactic neural network for character recognition

Jaravine, Viktor A., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 271 KB

english, 1992

28

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - CCD photoresponse calibration and contrast adjustment for reliable material discrimination in the inspection of electronic packages

Ford, Ralph M., Kerstens, Pieter J. M., Dorundo, Alan D., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 647 KB

english, 1992

29

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Automated vision system for inspection of wedge bonds

Sreenivasan, Koduri K., Srinath, Mandayam D., Khotanzad, Alireza R., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 455 KB

english, 1992

30

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Training feed-forward neural networks using conjugate gradients

Blue, James L., Grother, Patrick J., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 324 KB

english, 1992

31

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Using morphology and associative memories to associate salt-and-pepper noise with OCR error rates in document images

Concepcion, Vicente P., Grzech, Matthew P., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 296 KB

english, 1992

32

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Document understanding using layout styles of title page images

Sharpe II, Louis H., Manns, Basil, D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 280 KB

english, 1992

33

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Efficient Fourier image analysis algorithm for aligned rectangular and trapezoidal wafer structures

Shu, Chiao-Fe, Jain, Ramesh C., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 393 KB

english, 1992

34

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Calibration, setup, and performance evaluation in an IC inspection system

Dom, Byron E., Brecher, Virginia H., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 673 KB

english, 1992

35

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Minimization of false defect reporting in a patterned silicon wafer inspection system

Dralla, John R., Hoff, John C., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 2.32 MB

english, 1992

36

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Extraction of text boxes from engineering drawings

Chai, Ian, Dori, Dov, D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 350 KB

english, 1992

37

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Model-based control strategy for document image analysis

Fein, Frank, Hoenes, Frank, D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 869 KB

english, 1992

38

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Wafer examination and critical dimension estimation using scattered light

Krukar, Richard H., Gaspar, Susan M., Wilson, Scott R., Hush, Donald R., Naqvi, S. Sohail H., McNeil, John R., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 211 KB

english, 1992

39

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Gray-scale character recognition using boundary features

Lam, Stephen W., Girardin, Anthony C., Srihari, Sargur N., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 266 KB

english, 1992

40

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Recent advances in inspecting integrated circuits for pattern defects

Brecher, Virginia H., Dom, Byron E., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 348 KB

english, 1992

41

SPIE Proceedings [SPIE IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 6 February 1994)] Machine Vision Applications in Industrial Inspection II - Segmentation engine: a real-time image segmentation subsystem

Dom, Byron E., Blanz, Wolf-Ekkehard, Cox, Charles, Steele, David A., Dorundo, Alan D., Dawson, Benjamin M., Wilson, Stephen S., Wu, Frederick Y.

Year:

1994

Language:

english

File:

PDF, 1.32 MB

english, 1994

42

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Contextual analysis of machine-printed addresses

Cullen, Peter B., Ho, Tin K., Hull, Jonathan J., Prussak, Michal, Srihari, Sargur N., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 518 KB

english, 1992

43

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Estimation of linear stroke parameters using iterative total least squares methods

Van Mieghem, Jan A., Avi-Itzhak, Hadar I., Melen, Roger D., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 221 KB

english, 1992

44

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Massively parallel implementation of character recognition systems

Garris, Michael D., Wilson, Charles L., Blue, James L., Candela, Gerald T., Grother, Patrick J., Janet, Stanley A., Wilkinson, R. A., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari,

Year:

1992

Language:

english

File:

PDF, 525 KB

english, 1992

45

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Neural network approach to text processing

Sunthankar, S., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 200 KB

english, 1992

46

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Evaluation system for handwritten characters

Kato, Takahito, D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 381 KB

english, 1992

47

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Wafer pattern inspection using a Coherent Optical Processor

Cai, Xian-Yang, Kvasnik, Frank, D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 490 KB

english, 1992

48

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - One view of the methodology in handwriting character recognition

Pintsov, Leon A., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 359 KB

english, 1992

49

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Comparison of neural network classifiers for optical character recognition

Baker, Thomas E., McCartor, Hal, D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 549 KB

english, 1992

50

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Segmenting handwritten text lines into words using distance algorithms

Seni, Giovanni, Cohen, Edward, D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.

Year:

1992

Language:

english

File:

PDF, 477 KB

english, 1992

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